X-RAY-SCATTERING STUDIES OF SURFACE-ROUGHNESS OF GAAS ALAS MULTILAYERS/

Citation
Sk. Sinha et al., X-RAY-SCATTERING STUDIES OF SURFACE-ROUGHNESS OF GAAS ALAS MULTILAYERS/, Physica. B, Condensed matter, 198(1-3), 1994, pp. 72-77
Citations number
12
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
198
Issue
1-3
Year of publication
1994
Pages
72 - 77
Database
ISI
SICI code
0921-4526(1994)198:1-3<72:XSOSOG>2.0.ZU;2-S
Abstract
We discuss the theory of X-ray scattering from multilayers with confor mal roughness of the interfaces, and illustrate with an analysis of sp ecular, diffuse and wide-angle scattering from a GaAs/AlAs multilayer. This is a highly coherent multilayer structure deposited on a stepped , but otherwise smooth surface. The roughness due to the steps propaga tes through the layers and a distinct anisotropy is observed in the di ffuse scattering. We discuss a method to treat diffuse scattering from such surfaces with slightly irregular steps.