Cc. Li et al., ER-DOPED GLASS RIDGE-WAVE-GUIDE AMPLIFIERS FABRICATED WITH A COLLIMATED SPUTTER-DEPOSITION TECHNIQUE, IEEE photonics technology letters, 9(9), 1997, pp. 1223-1225
We report a new fabrication process for Er-doped glass ridge waveguide
s. The process does not require etching of an Er-doped film in definin
g the lateral dimension of a waveguide, but involves a liftoff process
using polyimide as a sacrificial layer. An Er-doped soda-lime silicat
e glass film (1.5-mu m thick) was deposited at 350 degrees C using a c
ollimated sputtering technique. Conventional sputtering techniques hav
e been known to be incompatible with a liftoff process. The collimated
sputtering, however, allowed us easy liftoff of Er-doped films, and p
roduced well-defined ridges with smooth surface profiles. A 1.7-cm-lon
g waveguide thus fabricated shows a 1.55-mu m signal enhancement of 15
.4 dB with a 980-nm pump power of 40 mW. This enhancement fully compen
sates for both Er absorption and waveguide losses, and results in a ga
in of 7.2 dB.