THE MAGNETIC-STRUCTURES OF PLANAR INTERFACES

The magnetization density profiles of two planar interfaces are deduce d from polarized neutron reflectometry measurements. The first interfa ce is the phase boundary between a thin Fe film and a MgO substrate; t he second, a [0 0 1] twist grain boundary between two thin films of Ni that were hot-pressed together. The atomic densities of both boundary regions were determined to be less than those of the neighboring thin films, while the average magnetic moments per atom were increased com pared to the bulk films.