A. Grochowski et al., INTEGRATED-CIRCUIT TESTING FOR QUALITY ASSURANCE IN MANUFACTURING - HISTORY, CURRENT STATUS, AND FUTURE-TRENDS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 44(8), 1997, pp. 610-633
Integrated circuit (IC) testing for quality assurance is approaching 5
0% of the manufacturing costs for some complex mixed signal IC's, For
many years the market growth and technology advancements in digital IC
's were driving the developments in testing, The increasing trend to i
ntegrate information acquisition and digital processing on the same ch
ip has spawned increasing attention to the test needs of mixed-signal
IC's, The recent advances in wireless communications indicate a trend
toward the integration of the RF and baseband mixed signal technologie
s, In this paper we examine the developments in IC testing form the hi
storic, current status and future view points, In separate sections we
address the testing developments for digital, mixed signal and RF IC'
s, With these reviews as context, we relate new test paradigms that ha
ve the potential to fundamentally alter the methods used to test mixed
-signal and RF parts.