HIGH-PRESSURE HIGH-TEMPERATURE XAFS INVESTIGATION ON HGTE

Citation
Y. Katayama et al., HIGH-PRESSURE HIGH-TEMPERATURE XAFS INVESTIGATION ON HGTE, Journal de physique. IV, 7(C2), 1997, pp. 1011-1012
Citations number
12
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
2
Pages
1011 - 1012
Database
ISI
SICI code
1155-4339(1997)7:C2<1011:HHXIOH>2.0.ZU;2-N
Abstract
X-ray absorption measurements at tile L-3 edge of Hg is solid and liqu id Hg/Te have been performed under high-temperature and high-pressure up to 1000 K and 3 GPa using a large volume Paris-Edinburgh press. EXA FS spectra have been analyzed with GNXAS approach. The pressure depend encies of tile nearest neighbor distance and the bond variance at room temperature as well as their variation with temperature at 0.6 GPa ha ve been obtained, The temperature dependence of the bond variance has been fitted to the Einstein model and is consistent to the decrease or the bulk modulus with increasing temperature, which has recently been shown to occur by an x-ray diffraction study.