XAFS MEASUREMENTS ON CO-K AND PT-L-III EDGES IN (111)COPT3 FILMS

Citation
C. Meneghini et al., XAFS MEASUREMENTS ON CO-K AND PT-L-III EDGES IN (111)COPT3 FILMS, Journal de physique. IV, 7(C2), 1997, pp. 1115-1117
Citations number
9
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
2
Pages
1115 - 1117
Database
ISI
SICI code
1155-4339(1997)7:C2<1115:XMOCAP>2.0.ZU;2-4
Abstract
XAFS measurements at the Co-K edge and Pt-L-III edge were performed in an (111) epitaxial CoPt3 film with strong perpendicular magnetic anis otropy. The analysis of XAFS data obtained using in-plane and out-of-p lane polarization show the existence of an anisotropic local order cha racterized by preferential heteroatomic pairs out of the him plane bal anced with preferential homoatomic pairs in the (111) plane. The isotr opic local order found in a magnetically isotropic CoPt3 film from Pt- L-III edge data should be confirmed by XAFS measurements on Co-edge.