M-3,M-2 AND L-3,L-2 XAFS OF AU AND PT NANOPARTICLES ON POROUS SILICON

XAFS measurements at both the M-3,M-2 and L-3,L-2 edges of Pt and Au a s well as scanning electron microscopy studies have been carried out f or a series of porous silicon specimens onto which fine particles of A u and Pt with nanometre and tens of nanometre dimensions have been dis persed. A wet chemistry technique developed in our laboratory was used for the deposition. The Au XAFS clearly show that the Au deposits are essentially Au metal while the Pt deposits exhibit Features that are noticeably different from that of metallic Pt. The M-3,M-2 and L-3,L-2 the XANES and their implications are discussed.