A finite-difference-time-domain and two finite-difference-thermal mode
ls are used to study various heating mechanisms in a near-field optica
l system. It is shown that the dominant mechanism of sample heating oc
curs from optical power that is transferred from the probe to a metall
ic thin-film sample. The optical power is absorbed in the sample and c
onverted to heat. The effects of thermal radiation from the probe's co
ating and thermal conduction between the probe and the sample are foun
d to be negligible. In a two-dimensional waveguide with TE polarizatio
n, most of the optical power is transferred directly from the aperture
to the sample. In a two-dimensional waveguide with TM polarization, t
here is significant optical power transfer between the probe's aluminu
m coating and the sample. The power transfer results in a wider therma
l distribution with TM polarization than with TE polarization. Using c
omputed temperature distributions in a Co-Pt film, we predict the rela
tive size of thermally written marks in a three-dimensional geometry.
The predicted mark size shows a 30% asymmetry that is due to polarizat
ion effects. (C) 1997 Optical Society of America.