THE PHENOMENOLOGICAL MODEL OF THE MICROWAVE SURFACE IMPEDANCE OF HIGH-TEMPERATURE SUPERCONDUCTING FILMS WITH MINIMIZED NUMBER OF FITTING PARAMETERS

Authors
VENDIK IB KAPARKOV DI SVISHCHEV AA
Citation
Ib. Vendik et al., THE PHENOMENOLOGICAL MODEL OF THE MICROWAVE SURFACE IMPEDANCE OF HIGH-TEMPERATURE SUPERCONDUCTING FILMS WITH MINIMIZED NUMBER OF FITTING PARAMETERS, Microwave and optical technology letters, 16(1), 1997, pp. 14-17
Citations number
11
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Microwave and optical technology letters → ACNP
ISSN journal
08952477
Volume
16
Issue
1
Year of publication
1997
Pages
14 - 17
Database
ISI
SICI code
0895-2477(1997)16:1<14:TPMOTM>2.0.ZU;2-K
Abstract
A correct phenomenological model of the microwave surface impedance of a high-temperature superconducting (HTS) film with reduced number of fitting parameters is presented. Simple empirical expressions are prop osed for London penetration depth at T = 0 K and for the residual resi stance parameter alpha versus the fitting parameter gamma considered a s a figure of merit of the HTS film at microwaves. The model is verifi ed by a comparison of results of modeling and measurement data in a wi de temperature range. (C) 1997 John Wiley & Sons, Inc.