EXPERIMENTAL-EVIDENCE OF NONACTIVATED CREEP IN PB(ZRXTI1-X)O-3 CERAMICS AT LOW-TEMPERATURES

Citation
E. Perezenciso et al., EXPERIMENTAL-EVIDENCE OF NONACTIVATED CREEP IN PB(ZRXTI1-X)O-3 CERAMICS AT LOW-TEMPERATURES, Physical review. B, Condensed matter, 56(6), 1997, pp. 2900-2903
Citations number
35
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
56
Issue
6
Year of publication
1997
Pages
2900 - 2903
Database
ISI
SICI code
0163-1829(1997)56:6<2900:EONCIP>2.0.ZU;2-H
Abstract
The piezoelectric deformation of a commercial Pb(ZrxTi1-x)O-3 ceramic has been measured down to 0.4 K. The length relaxation (or creep) orig inated by a change in the applied electric field, has been followed fo r seven decades of time. Extrapolation of our results shows that this relaxation does not disappear at 0 K. That is indicative that nonactiv ated processes are responsible for the piezoelectric relaxation near O K.