E. Perezenciso et al., EXPERIMENTAL-EVIDENCE OF NONACTIVATED CREEP IN PB(ZRXTI1-X)O-3 CERAMICS AT LOW-TEMPERATURES, Physical review. B, Condensed matter, 56(6), 1997, pp. 2900-2903
The piezoelectric deformation of a commercial Pb(ZrxTi1-x)O-3 ceramic
has been measured down to 0.4 K. The length relaxation (or creep) orig
inated by a change in the applied electric field, has been followed fo
r seven decades of time. Extrapolation of our results shows that this
relaxation does not disappear at 0 K. That is indicative that nonactiv
ated processes are responsible for the piezoelectric relaxation near O
K.