ONSET OF INTERSTITIAL DIFFUSION DETERMINED BY SCANNING-TUNNELING-MICROSCOPY

Citation
M. Morgenstern et al., ONSET OF INTERSTITIAL DIFFUSION DETERMINED BY SCANNING-TUNNELING-MICROSCOPY, Physical review letters, 79(7), 1997, pp. 1305-1308
Citations number
18
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
79
Issue
7
Year of publication
1997
Pages
1305 - 1308
Database
ISI
SICI code
0031-9007(1997)79:7<1305:OOIDDB>2.0.ZU;2-8
Abstract
A new method using variable temperature scanning tunneling microscopy (STM) to determine the onset temperature of the diffusion of self-inte rstitial atoms is presented. The interstitials are produced by a low f luence of Ne+ (4.5 keV) bombardment of Pt(111) at 20 K. At 22 K, the i nterstitials become mobile and migrate to the surface where they pop o ut and can be detected as new adatoms by STM. The time dependence of t he appearance of the interstitials at the surface is measured for two temperatures, allowing estimation of the diffusion parameters.