We systematically studied the photoconductivity of nominally intrinsic
diamond films grown by two CVD methods. In the 200-275 nm wavelength
range covering the bandgap energy (5.5 eV or 225 nm), the measured pho
tocurrent showed characteristic behavior that can be quantitatively re
lated to a fast recombination of electrons and effective trapping of h
oles, mainly by trap states near the valence band edge, In addition to
photoconductivity, thermoelectric emission spectroscopy and thermally
stimulated current measurements were made. From the results, the dens
ity and location of two distinctive trap levels within the energy band
gap was estimated. The results are not only self-consistent, but also
agree with other authors' findings, such as a hole-dominated current,
without or under bandgap illumination, a Fermi level close to the vale
nce band edge, an electron recombination center in the middle of the b
andgap, and a shallow hole-trap state having an extremely high density
of similar to 10(19) cm(-3). Based on these data, we suggest a bandga
p and trap-state model for intrinsic CVD diamond. The details of this
model and the characteristic properties of the defects/traps are consi
stent with experimental results and theoretical findings made by other
authors covering a large diversity of areas, such as photoluminescenc
e and cathodoluminescence, photoabsorption, carrier lifetimes and mobi
lities, electron paramagnetic resonance, cold-cathode electron emissio
n, and photoconductive current switching. (C) 1997 Elsevier Science S.
A.