ENHANCED LOCAL SURFACE CONDUCTIVITY MEASUREMENTS BY SCANNING-TUNNELING-MICROSCOPY

Authors
MULLER F MULLER AD MEISSNER O HEILMANN A HIETSCHOLD M
Citation
F. Muller et al., ENHANCED LOCAL SURFACE CONDUCTIVITY MEASUREMENTS BY SCANNING-TUNNELING-MICROSCOPY, Review of scientific instruments, 68(8), 1997, pp. 3104-3107
Citations number
13
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
68
Issue
8
Year of publication
1997
Pages
3104 - 3107
Database
ISI
SICI code
0034-6748(1997)68:8<3104:ELSCMB>2.0.ZU;2-I
Abstract
A scanning tunneling microscope with a completely digital control is d escribed which is able to determine in addition to the sample topograp hy the local reactance of the surface by using a mathematical procedur e. The new types of information allow a more detailed discussion of su rface properties. The measurements were carried out at gold films on s ilicon wafers. On a plasma polymer gold composite surface typical reac tance differences will be demonstrated. (C) 1997 American Institute of Physics.