This paper studies deviations of open-loop properties in the presence
of modeling uncertainties. Our aim is to gain insights into how open-l
oop properties and thus potentially closed-loop properties may vary in
the face of a diagonally structured uncertainty. We give several esti
mates for the worst case deviations of the open-loop transfer function
in terms of certain structured singular values and their bounds, and
also in terms of certain scaled plant condition numbers, the relative
pin array, and the block relative gains. Our analysis shows that the e
stimates in terms of the structured singular values and bounds are tig
ht in general, so are those in terms of the condition numbers for cert
ain cases studied previously in the literature. We show that the worst
case deviation will be large when the estimates stated in terms of th
e structured singular values, or under certain circumstances in terms
of the condition numbers, are large. On the other hand, an example is
constructed to show that the relative pin array and block relative pin
s may be optimistic measures in assessing these deviations. The develo
pments here support and reinforce previous conjectures and results whi
ch assert that plants with large condition numbers and/or relative gai
ns are potentially difficult to control.