X-RAY MICRODIFFRACTION ANALYSIS OF MM-SCALE ORIENTATIONAL CORRELATIONS IN TL-1223 HIGH-CRITICAL-CURRENT, HIGH-TEMPERATURE SUPERCONDUCTING FILMS

Authors
SPECHT ED GOYAL A KROEGER DM DELUCA JA TKACZYK JE BRIANT CL SUTLIFF JA
Citation
Ed. Specht et al., X-RAY MICRODIFFRACTION ANALYSIS OF MM-SCALE ORIENTATIONAL CORRELATIONS IN TL-1223 HIGH-CRITICAL-CURRENT, HIGH-TEMPERATURE SUPERCONDUCTING FILMS, Physica. C, Superconductivity, 226(1-2), 1994, pp. 76-84
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
226
Issue
1-2
Year of publication
1994
Pages
76 - 84
Database
ISI
SICI code
0921-4534(1994)226:1-2<76:XMAOMO>2.0.ZU;2-L
Abstract
Tl1-yBa2Ca2Cu3Ox, y < 0.2, (Tl-1223) films grown on polycrystalline yt tria-stabilized zirconia (YSZ) substrates exhibit a microstructure com mon in high-critical-current, high-temperature superconducting films. Plate-like grains are aligned with c-axes normal to the film; a- and b -axes are randomly oriented on a macroscopic scale. We describe X-ray pole-figure measurements from 0.1 mm regions of Tl-1223 films. For sam ples with the highest critical currents, the a-axes of the grains are locally aligned over distances up to 1 mm. Regions of higher critical current are associated with regions of high a-axis alignment.