CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY OF SEMICONDUCTOR HETEROSTRUCTURES

Authors
Citation
Et. Yu, CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY OF SEMICONDUCTOR HETEROSTRUCTURES, MRS bulletin, 22(8), 1997, pp. 22-26
Citations number
28
Categorie Soggetti
Material Science","Physics, Applied
Journal title
ISSN journal
08837694
Volume
22
Issue
8
Year of publication
1997
Pages
22 - 26
Database
ISI
SICI code
0883-7694(1997)22:8<22:CSOSH>2.0.ZU;2-0