IN-SITU SURFACE X-RAY-DIFFRACTION USING A NEW ELECTROCHEMICAL-CELL OPTIMIZED FOR 3RD-GENERATION SYNCHROTRON LIGHT-SOURCES

Citation
F. Brossard et al., IN-SITU SURFACE X-RAY-DIFFRACTION USING A NEW ELECTROCHEMICAL-CELL OPTIMIZED FOR 3RD-GENERATION SYNCHROTRON LIGHT-SOURCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(3), 1997, pp. 419-422
Citations number
9
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
129
Issue
3
Year of publication
1997
Pages
419 - 422
Database
ISI
SICI code
0168-583X(1997)129:3<419:ISXUAN>2.0.ZU;2-5
Abstract
Thanks to the new third-generation high energy synchrotron radiation s ources it is now possible to study electrochemical interfaces in situ using a cell fulfilling all the electrochemistry requirements. We are presenting here one version of this cell type, especially designed for surface X-ray diffraction. Its geometry allows in and out of plane da ta collection with the voltammetry fully controlled at any time. Fresh results concerning the gold (111) surface evolution in diluted H2SO4 electrolyte are presented. Finally, the perspectives opened by this in situ studies are discussed.