TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) ANALYSIS OFTHE ORGUEIL-CI METEORITE AT HIGH LATERAL RESOLUTION

Authors
STEPHAN T ROST D JESSBERGER EK KLOCK W
Citation
T. Stephan et al., TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) ANALYSIS OFTHE ORGUEIL-CI METEORITE AT HIGH LATERAL RESOLUTION, Meteoritics & planetary science, 32(4), 1997, pp. 124-125
Citations number
7
Categorie Soggetti
Geochemitry & Geophysics
Journal title
Meteoritics & planetary science → ACNP
ISSN journal
10869379
Volume
32
Issue
4
Year of publication
1997
Supplement
S
Pages
124 - 125
Database
ISI
SICI code
1086-9379(1997)32:4<124:TSM