T. Holden et al., SPECTRAL ELLIPSOMETRY INVESTIGATION OF ZN0.53CD0.47SE LATTICE-MATCHEDTO INP, Physical review. B, Condensed matter, 56(7), 1997, pp. 4037-4046
Spectral ellipsometry at 300 K, in the range 0.8-5.5 eV, has been used
to study the bulk and surface oxide properties of a molecular-beam-ep
itaxy grown Zn0.53Cd0.47Se/InP film (approximate to 1 mu m thick). We
have observed the direct gap E-0, which exhibits a well-defined excito
nic structure, its spin-orbit split component E-0+Delta(0), as well as
the spin-orbit split E-1, E-1+Delta(1) doublet. The experimental data
over the entire measured spectral range (after oxide removal) have be
en fit using a model dielectric function based on the electronic energ
y-band structure near critical points plus excitonic and Coulomb enhan
cement effects. The influence of a native oxide on the optical propert
ies also was investigated.