COMPUTER-AIDED SYSTEM FOR MEASURING THE STATIC PARAMETERS OF SEMICONDUCTOR-DEVICES

Authors
PETROV VN PETROV MN
Citation
Vn. Petrov et Mn. Petrov, COMPUTER-AIDED SYSTEM FOR MEASURING THE STATIC PARAMETERS OF SEMICONDUCTOR-DEVICES, Measurement techniques, 39(12), 1996, pp. 1239-1243
Citations number
2
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Measurement techniques → ACNP
ISSN journal
05431972
Volume
39
Issue
12
Year of publication
1996
Pages
1239 - 1243
Database
ISI
SICI code
0543-1972(1996)39:12<1239:CSFMTS>2.0.ZU;2-E
Abstract
A computer-aided system for measuring the static parameters of semicon ductor devices is described. The system is controlled by a personal co mputer. A hierarchy of models is formed from the results of the measur ements from the simplest behavioral models to the accurate physical mo dels used in computer-aided design systems.