ELECTRON-BEAM-INDUCED FULLERITE STRUCTURE TRANSFORMATION

Auger spectra of thin fullerite (C-60) films have been measured under the conditions precluding their electrostatic charging and destruction . The Auger line of these subjects, E-f=268.3+/-0.2 eV, turned out to lie considerably lower in energy than that of the ion-beam amorphized graphite (E-AG=272.3+/-0.2 eV) and of pyrographite (E-PG=271.8+/-0.5 e V). Fullerite was found to convert to a graphitic form under irradiati on by low-intensity electron beams used customarily in AES, reflection EELS, and inverse photoemission spectroscopy. It has been established that such beams produce noticeable changes in the fullerite structure already in a few minutes of irradiation. (C) 1997 American Institute of Physics.