DETERMINING THE POROSITY OF SYNTHETIC OPALS AND POROUS SILICON BY X-RAY-METHODS

Authors
RATNIKOV VV
Citation
Vv. Ratnikov, DETERMINING THE POROSITY OF SYNTHETIC OPALS AND POROUS SILICON BY X-RAY-METHODS, Physics of the solid state, 39(5), 1997, pp. 856-858
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physics of the solid state → ACNP
ISSN journal
10637834
Volume
39
Issue
5
Year of publication
1997
Pages
856 - 858
Database
ISI
SICI code
1063-7834(1997)39:5<856:DTPOSO>2.0.ZU;2-7
Abstract
A simple method is proposed for determining the porosity of fractal ma terials by measuring the absorption of x rays as they pass through the se samples. The method makes it possible to measure the integrated por osity of objects rapidly, does not require special preparation of the objects, is not contaminating, and does not destroy their structure. T he possibilities of this method are demonstrated for the examples of s ynthetic opals and porous silicon. (C) 1997 American Institute of Phys ics.