We have developed a novel molecular beam mass spectrometry technique t
hat can quantitatively analyze the gas-phase composition in a chemical
vapor deposition (CVD) reactor. The technique simultaneously monitors
a wide variety of radical and stable species, and their concentration
s can be determined with sensitivities approaching 1 ppm. Measurements
performed in a diamond deposition system have provided keen insights
into the important phenomena that affect the growth environment. In th
is paper we first discuss the primary gas sampling design issues. In t
he second part, details of the experimental results and their implicat
ions are described.