THE FUTURE OF TEST AND DFT

Authors
SINGER G
Citation
G. Singer, THE FUTURE OF TEST AND DFT, IEEE design & test of computers, 14(3), 1997, pp. 11-14
Citations number
NO
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
14
Issue
3
Year of publication
1997
Pages
11 - 14
Database
ISI
SICI code
0740-7475(1997)14:3<11:TFOTAD>2.0.ZU;2-U
Abstract
In his keynote speech at the 1997 VLSI Test Symposium, held in April i n Monterey, California, Gadi Singer presented his view of the future o f test and design for testability. In addition, Singer, general manage r of design technology at Intel Corporation, where he has worked for 1 5 years, posed several challenges to the design and test community. He re, he summarizes his major points.