A BIST AND BOUNDARY-SCAN ECONOMICS FRAMEWORK

Authors
MIRANDA JM
Citation
Jm. Miranda, A BIST AND BOUNDARY-SCAN ECONOMICS FRAMEWORK, IEEE design & test of computers, 14(3), 1997, pp. 17-23
Citations number
8
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
14
Issue
3
Year of publication
1997
Pages
17 - 23
Database
ISI
SICI code
0740-7475(1997)14:3<17:ABABEF>2.0.ZU;2-2
Abstract
BIST and boundary scan affect cost at all levels of product integratio n and during all phases of the product life cycle. This analysis frame work helps developers decide if the benefits are worth the costs.