COST-DRIVEN RANKING OF MEMORY ELEMENTS FOR PARTIAL INTRUSION

Authors
ABADIR M KAPUR R
Citation
M. Abadir et R. Kapur, COST-DRIVEN RANKING OF MEMORY ELEMENTS FOR PARTIAL INTRUSION, IEEE design & test of computers, 14(3), 1997, pp. 45-50
Citations number
10
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
14
Issue
3
Year of publication
1997
Pages
45 - 50
Database
ISI
SICI code
0740-7475(1997)14:3<45:CROMEF>2.0.ZU;2-9
Abstract
DFT techniques such as scan, BIST, or test point insertion intrude the circuitry for ease of testing. However, testing ease incurs increased silicon area requirements and performance penalties. The authors pres ent a method of identifying cost-effective intermediate solutions.