AUTOMATED DIAGNOSIS IN TESTING AND FAILURE ANALYSIS

Authors
BUTLER KM JOHNSON K PLATT J KINRA A SAXENA J
Citation
Km. Butler et al., AUTOMATED DIAGNOSIS IN TESTING AND FAILURE ANALYSIS, IEEE design & test of computers, 14(3), 1997, pp. 83-89
Citations number
12
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
14
Issue
3
Year of publication
1997
Pages
83 - 89
Database
ISI
SICI code
0740-7475(1997)14:3<83:ADITAF>2.0.ZU;2-W
Abstract
To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast be coming mandatory, The authors describe the development and deployment of an automated diagnosis methodology within Texas Instruments.