ESTIMATION OF THE 2ND CROSSOVER IN INSULATORS USING THE ELECTROSTATICMIRROR IN THE SCANNING ELECTRON-MICROSCOPE

Authors
WONG WK PHANG JCH THONG JTL
Citation
Wk. Wong et al., ESTIMATION OF THE 2ND CROSSOVER IN INSULATORS USING THE ELECTROSTATICMIRROR IN THE SCANNING ELECTRON-MICROSCOPE, Applied physics letters, 71(9), 1997, pp. 1270-1272
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
71
Issue
9
Year of publication
1997
Pages
1270 - 1272
Database
ISI
SICI code
0003-6951(1997)71:9<1270:EOT2CI>2.0.ZU;2-J
Abstract
A technique for measuring the second secondary emission crossover in i nsulators was developed. The method utilizes the behavior of an electr ostatic mirror formed on insulating-samples to estimate the current eq uilibrium point as well as the mirror potential. Current results show that the value of the second crossover for glass passivation obtained using this method is in general agreement with previous techniques. (C ) 1997 American Institute of Physics.