I. Diel et al., OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS, Applied optics, 36(25), 1997, pp. 6376-6382
Angular-dependent reflectivity was measured with a dynamic range of 5-
6 orders of magnitude at similar to 20 different photon energies in th
e range from 40 to 800 eV with the HASYLAB reflectometer with synchrot
ron radiation. Several float-glass substrates and a number of sputtere
d Ni and G films were investigated to improve the accuracy. The optica
l constants mere obtained from least-squares fits of theoretical refle
ctivity curves, taking into account the influence of film thicknesses
and surface and interface roughnesses. All samples with Ni and C films
were produced on float-glass substrates, with Ar as the sputter gas,
in the low-pressure triode-assisted sputtering facility of the Sincrot
rone Trieste. (C) 1997 Optical Society of America.