OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS

Citation
I. Diel et al., OPTICAL-CONSTANTS OF FLOAT GLASS, NICKEL, AND CARBON FROM SOFT-X-RAY REFLECTIVITY MEASUREMENTS, Applied optics, 36(25), 1997, pp. 6376-6382
Citations number
21
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
36
Issue
25
Year of publication
1997
Pages
6376 - 6382
Database
ISI
SICI code
0003-6935(1997)36:25<6376:OOFGNA>2.0.ZU;2-X
Abstract
Angular-dependent reflectivity was measured with a dynamic range of 5- 6 orders of magnitude at similar to 20 different photon energies in th e range from 40 to 800 eV with the HASYLAB reflectometer with synchrot ron radiation. Several float-glass substrates and a number of sputtere d Ni and G films were investigated to improve the accuracy. The optica l constants mere obtained from least-squares fits of theoretical refle ctivity curves, taking into account the influence of film thicknesses and surface and interface roughnesses. All samples with Ni and C films were produced on float-glass substrates, with Ar as the sputter gas, in the low-pressure triode-assisted sputtering facility of the Sincrot rone Trieste. (C) 1997 Optical Society of America.