OPTICAL AND MICROWAVE PROPERTIES OF METAL-INSULATOR THIN-FILMS - POSSIBILITY OF LIGHT LOCALIZATION

High frequency response (optical, infrared and microwave) of thin meta l-dielectric inhomogeneous films is studied. We propose a new approach based on a direct solution of Maxwell's equations without having to i nvoke the quasi-static approximation. Our theory reproduces most of th e known experimental results including the anomalous absorption near a percolation threshold. For the strong skin effect case or for superco nducting-dielectric films we predict an electromagnetic wave localisat ion at the percolation threshold.