M. Lepage et al., LOW-ENERGY-ELECTRON TOTAL SCATTERING CROSS-SECTION FOR THE PRODUCTIONOF CO WITHIN CONDENSED METHANOL, The Journal of chemical physics, 107(9), 1997, pp. 3478-3484
We propose a method based on high-resolution electron-energy-loss spec
troscopy to measure in situ the neutral fragmentation products arising
from the impact of low energy electrons on thin solid films at low te
mperature. We show more particularly that the detection of electronic
states from a dissociation product is a good alternative when the corr
esponding vibrational levels are obscured by those of the deposited fi
lm. In the case of thin methanol film condensed at 18 K, we find that
low energy electrons can dissociate the CH3OH molecules into CO fragme
nts that remain within the film. The production of CO fragments, clear
ly identified from its lowest electronic state a (3) Pi, is studied as
a function of the electron dose, electron energy, and film thickness.
The energy dependence of the CO production rate, which is also calibr
ated in terms of an electron total scattering cross section sigma(p),
is characterized by an energy threshold at 8eV, a shoulder at about 11
.5 eV, a broad maximum centered around 14 eV, and a rise above 19 eV.
A value of sigma(p) approximate to 4.2 x 10(-18) cm(2) is Obtained at
14 eV. The shoulder and the broad maximum are specifically attributed
to the ...(6a')(1)(3sa')(2),(2)A', ...(1a '')1(3sa')2(,2)A '', and ...
(5a')(1)(3sa')(2),(2)A' core excited electron resonances, which decay
into their parent repulsive states. The rise above 19 eV is correlated
to the lowest dissociative photoionization processes known to produce
neutral CO in the gas phase. (C) 1997 American Institute of Physics.