POLARIZATION OF OUT-OF-PLANE SCATTERING FROM MICROROUGH SILICON

Authors
GERMER TA ASMAIL CC SCHEER BW
Citation
Ta. Germer et al., POLARIZATION OF OUT-OF-PLANE SCATTERING FROM MICROROUGH SILICON, Optics letters, 22(17), 1997, pp. 1284-1286
Citations number
10
Categorie Soggetti
Optics
Journal title
Optics letters → ACNP
ISSN journal
01469592
Volume
22
Issue
17
Year of publication
1997
Pages
1284 - 1286
Database
ISI
SICI code
0146-9592(1997)22:17<1284:POOSFM>2.0.ZU;2-E
Abstract
The polarization of light scattered by silicon with a small degree of microroughness was measured out of the plane of incidence. First-order vector perturbation theory for scattering from a rough surface predic ts the behavior well. The data and the theory show Brewster-like angle s where p --> p scattering from surface microroughness vanishes, as we ll as a deterministic polarization in other directions.