We measure the transverse spatial distribution of the gain region for
the 19.6-nm neonlike germanium laser line by use of a short amplifier,
which is backlit by a longer laser, both of which are created by illu
mination of a germanium slab target with a series of short 100-ps puls
es from the Nova laser. The backlighting technique enables us to reduc
e greatly the refraction effects that dominated previous imaging exper
iments and made direct gain measurements impossible. Measurements are
made with a two-dimensional high-resolution spatial-imaging diagnostic
, and simulations of the gain are compared with experiments. (C) 1997
Optical Society of America.