A COMPILATION OF NEW AND PUBLISHED MAJOR AND TRACE-ELEMENT DATA FOR NIST SRM-610 AND NIST SRM-612 GLASS REFERENCE MATERIALS

Microanalytical trace element techniques (such as ion probe or laser a blation ICP-MS) are hampered by a lack of well characterized, homogene ous standards. Two silicate glass reference materials produced by Nati onal Institute of Standards and Technology (NIST), NIST SRM 610 and NI ST SRM 612, have been shown to be homogeneous and are spiked with up t o sixty one trace elements at nominal concentrations of 500 mu g g(-1) and 50 mu g g(-1) respectively. These samples (supplied as 3 mm wafer s) are equivalent to NIST SRM 611 and NIST SRM 613 respectively (which are supplied as 1 mm wafers) and are becoming more widely used as pot ential microanalytical reference materials. NIST however, only certifi es vp to eight elements in these glasses. Here we have compiled concen tration data from approximately sixty published works for both glasses , and have produced new analyses from our laboratories. Compilations a re presented for the matrix composition of these glasses and for fifty eight trace elements. The trace element data includes all available n ew and published data, and summaries present the overall average and s tandard deviation, the range, median, geometric mean and a preferred a verage (which excludes all data outside +/- one standard deviation of the overall average). For the elements which have been certified, ther e is a good agreement between the compiled averages and the NIST data. This compilation is designed to provide useful new working values for these reference materials.