The photoluminescence (PL) of InAs and GaInAsSb/InAs epilayers grown b
y Gd-doped liquid-phase epitaxy (LPE) has been investigated using a do
uble-modulation Fourier transform infrared spectrometer (FTIR). The sp
ectra were composed of peaks due to band-to-band, band-to-impurities,
and exciton recombinations. The excitation power, temperature and Gd c
oncentration dependences of these features were studied. The temperatu
re dependence of the band-to-band transition energies was examined by
measuring FTIR, transmission spectra and by comparing experimental res
ults with those obtained with an empirical formula. A PL full width at
half-maximum (FWHM) as narrow as 4.35 meV has been achieved for GaInA
sSb epilayers grown from Gd-doped melt indicating high purity of epila
yers. Raman scattering measurements of GaInAsSb epilayers showed a two
-mode behavior for the optical phonons, indicating that homogeneous, h
igh-quality epilayers were achieved.