ENHANCED SENSITIVITY TO OXIDE SURFACE-DEFECTS USING AUGER-PHOTOELECTRON COINCIDENCE SPECTROSCOPY

Citation
Ak. See et al., ENHANCED SENSITIVITY TO OXIDE SURFACE-DEFECTS USING AUGER-PHOTOELECTRON COINCIDENCE SPECTROSCOPY, Surface science, 383(2-3), 1997, pp. 735-741
Citations number
32
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
383
Issue
2-3
Year of publication
1997
Pages
735 - 741
Database
ISI
SICI code
0039-6028(1997)383:2-3<735:ESTOSU>2.0.ZU;2-8
Abstract
We present Auger-photoelectron coincidence (APECS) spectra of the Ti 3 p core level obtained in coincidence with Ti M2,3VV Auger electrons fr om the stoichiometric and Vacuum annealed TiO2(110) surfaces. For both surfaces, emission corresponding to reduced oxidation states has appr oximately an order of magnitude greater relative intensity in the coin cidence spectrum as compared with the corresponding ordinary (singles) photoemission spectrum. We associate the excess coincidence signal fr om the stoichiometric surface with previously undetected residual defe cts. The origins and implications of the enhanced sensitivity of APECS to defects at oxide surfaces is discussed. (C) 1997 Elsevier Science B.V.