STEP-EDGE BARRIERS - TRUTHS AND KINETIC CONSEQUENCES

Authors
Citation
K. Kyuno et G. Ehrlich, STEP-EDGE BARRIERS - TRUTHS AND KINETIC CONSEQUENCES, Surface science, 383(2-3), 1997, pp. 766-774
Citations number
34
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
383
Issue
2-3
Year of publication
1997
Pages
766 - 774
Database
ISI
SICI code
0039-6028(1997)383:2-3<766:SB-TAK>2.0.ZU;2-O
Abstract
Observations of individual atoms on metal surfaces have shown that the diffusion potential at descending steps is not the simple repulsive b arrier usually assumed in crystal growth. Instead, atoms may be held i n asymmetric traps at step edges, and there are significant distortion s of the potential near ascending steps. That the presence of step-edg e traps instead of repulsive barriers can have a crucial effect on ato mic kinetics is demonstrated by analyzing three processes important in crystal growth: the lifetime of atoms before incorporating into a clu ster, dissociation of atoms from lattice steps, and incorporation on v icinal surfaces. (C) 1997 Elsevier Science B.V.