HIGH-RESOLUTION ATOMIC-FORCE MICROSCOPY OF DEXTRAN MONOLAYER HYDRATION

Citation
Ra. Frazier et al., HIGH-RESOLUTION ATOMIC-FORCE MICROSCOPY OF DEXTRAN MONOLAYER HYDRATION, Langmuir, 13(18), 1997, pp. 4795-4798
Citations number
27
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
13
Issue
18
Year of publication
1997
Pages
4795 - 4798
Database
ISI
SICI code
0743-7463(1997)13:18<4795:HAMODM>2.0.ZU;2-U
Abstract
Atomic force microscopy has been employed for the in situ investigatio n of the molecular hydration of thiolated dextran monolayers within a liquid environment. The studies have demonstrated the ability to measu re corresponding changes in both monolayer morphology and elasticity d ue to the hydration state of dextran. Imaging in water allows the visu alization of macromolecular swelling, matched by an increase in surfac e elasticity monitored via the analysis of force-distance curves. Subs equent imaging in a propanol environment leads to dehydration effects observed through a relaxation of swelling and a decrease in surface el asticity.