CHARACTERIZATION OF STRAY ELECTRIC-FIELDS IN NIOBIUM CAVITIES USING ULTRA-HIGH-RESOLUTION SPECTROSCOPY

Citation
M. Weidinger et al., CHARACTERIZATION OF STRAY ELECTRIC-FIELDS IN NIOBIUM CAVITIES USING ULTRA-HIGH-RESOLUTION SPECTROSCOPY, Optics communications, 141(5-6), 1997, pp. 273-278
Citations number
15
Categorie Soggetti
Optics
Journal title
ISSN journal
00304018
Volume
141
Issue
5-6
Year of publication
1997
Pages
273 - 278
Database
ISI
SICI code
0030-4018(1997)141:5-6<273:COSEIN>2.0.ZU;2-R
Abstract
We present the results of an experiment in which the stray fields in a niobium probe were measured. This probe simulated the entrance/exit h oles of a high-Q cylindrical cavity (micromaser in Garching) where int erference effects, attributed to these stray fields, have been observe d [Raithel et al., Phys. Rev. Lett. 75 (1995) 3446]. The gradient of t he stray electric fields was measured in both the metallic and superco nducting phases with ultra high resolution spectroscopy which used a c ombination of the Doppler free two photon method and the technique of successive oscillatory fields, We obtain a value of 300 mV/cm for the electric field for both phases which is in excellent agreement with th e determination of Raithel et al. (C) 1997 Elsevier Science B.V.