TRANSMISSION ELECTRON-MICROSCOPY STUDY OF STACKING-FAULT TRAPEZOIDS AND STACKING-FAULT TUBES IN ZNSE GAAS(001) PSEUDOMORPHIC EPITAXIAL LAYERS/

Citation
N. Wang et al., TRANSMISSION ELECTRON-MICROSCOPY STUDY OF STACKING-FAULT TRAPEZOIDS AND STACKING-FAULT TUBES IN ZNSE GAAS(001) PSEUDOMORPHIC EPITAXIAL LAYERS/, Philosophical magazine letters, 76(3), 1997, pp. 153-158
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09500839
Volume
76
Issue
3
Year of publication
1997
Pages
153 - 158
Database
ISI
SICI code
0950-0839(1997)76:3<153:TESOST>2.0.ZU;2-L
Abstract
Using the classical stacking-fault pyramid as an internal reference, t he fault planes and stair-rod dislocations in stacking-fault trapezoid s and stacking-fault tubes in pseudomorphic ZnSe/GaAs(001) epitaxial l ayers have been characterized. The acute-obtuse stair-rod dislocation pair in a stacking-fault trapezoid form an extended C dislocation dipo le. Stacking faults with a lozenge-shaped cross-section in a stacking- fault tube intersect to give rise to dislocation dipoles of alternatin g acute-obtuse stair-rod dislocations. The extended dislocation dipole s of the stacking-fault trapezoids and stacking-fault tubes can act as diffusion channels for pipe diffusion of point defects during the deg radation process.