X-RAY OPTICS FOR MU-EV-RESOLVED SPECTROSCOPY

Authors
ROHLSBERGER R GERDAU E RUFFER R STURHAHN W TOELLNER TS CHUMAKOV AI ALP EE
Citation
R. Rohlsberger et al., X-RAY OPTICS FOR MU-EV-RESOLVED SPECTROSCOPY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 394(1-2), 1997, pp. 251-255
Citations number
18
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
394
Issue
1-2
Year of publication
1997
Pages
251 - 255
Database
ISI
SICI code
0168-9002(1997)394:1-2<251:XOFMS>2.0.ZU;2-K
Abstract
A new spectroscopic technique is introduced that allows tuning of a mu eV-wide beam of synchrotron radiation over a range of a few meV. It r elies on nuclear resonant scattering in combination with a polarizatio n filtering technique. The spectrometer consists of a crystal polarize r/analyzer pair in crossed setting with a grazing incidence reflection from a Fe-57-coated rotating mirror in between that acts as Doppler s hifter. The demonstrated features of the new technique lay a base for mu eV-resolved inelastic X-ray spectroscopy.