FINE ATOMIC IMAGE OF MICA CLEAVAGE PLANES OBTAINED WITH AN ATOMIC-FORCE MICROSCOPE (AFM) AND A NOVEL PROCEDURE FOR IMAGE-PROCESSING

Citation
M. Baba et al., FINE ATOMIC IMAGE OF MICA CLEAVAGE PLANES OBTAINED WITH AN ATOMIC-FORCE MICROSCOPE (AFM) AND A NOVEL PROCEDURE FOR IMAGE-PROCESSING, Chemical physics, 221(1-2), 1997, pp. 23-31
Citations number
10
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
Journal title
ISSN journal
03010104
Volume
221
Issue
1-2
Year of publication
1997
Pages
23 - 31
Database
ISI
SICI code
0301-0104(1997)221:1-2<23:FAIOMC>2.0.ZU;2-O
Abstract
Potassium layers and basal oxygen layers in muscovite and biotite clea vage planes were clearly discerned by an atomic force microscope (AFM) with a novel procedure for image processing. Unit cell sizes of musco vite and biotite determined by this procedure were in good accordance with those determined by X-ray structural analysis. Expected differenc es in the structures of muscovite and biotite, that is, the atomic arr angement of oxygen in the tetrahedral sheet, were clearly demonstrated from the processed images. (C) 1997 Elsevier Science B.V.