FINE ATOMIC IMAGE OF MICA CLEAVAGE PLANES OBTAINED WITH AN ATOMIC-FORCE MICROSCOPE (AFM) AND A NOVEL PROCEDURE FOR IMAGE-PROCESSING
Citation
M. Baba et al., FINE ATOMIC IMAGE OF MICA CLEAVAGE PLANES OBTAINED WITH AN ATOMIC-FORCE MICROSCOPE (AFM) AND A NOVEL PROCEDURE FOR IMAGE-PROCESSING, Chemical physics, 221(1-2), 1997, pp. 23-31
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
SICI code
0301-0104(1997)221:1-2<23:FAIOMC>2.0.ZU;2-O
Abstract
Potassium layers and basal oxygen layers in muscovite and biotite clea
vage planes were clearly discerned by an atomic force microscope (AFM)
with a novel procedure for image processing. Unit cell sizes of musco
vite and biotite determined by this procedure were in good accordance
with those determined by X-ray structural analysis. Expected differenc
es in the structures of muscovite and biotite, that is, the atomic arr
angement of oxygen in the tetrahedral sheet, were clearly demonstrated
from the processed images. (C) 1997 Elsevier Science B.V.