PRESENT DEVELOPMENTS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

Authors
ERNST F RUHLE M
Citation
F. Ernst et M. Ruhle, PRESENT DEVELOPMENTS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Current opinion in solid state & materials science, 2(4), 1997, pp. 469-476
Citations number
46
Categorie Soggetti
Material Science","Physics, Applied","Physics, Condensed Matter
Journal title
Current opinion in solid state & materials science → ACNP
ISSN journal
13590286
Volume
2
Issue
4
Year of publication
1997
Pages
469 - 476
Database
ISI
SICI code
1359-0286(1997)2:4<469:PDIHTE>2.0.ZU;2-E
Abstract
High-resolution transmission electron microscopy (HRTEM) now approache s a resolution of 1 Angstrom, combining recent instrumental developmen ts with innovative strategies of imaging and image processing. Moreove r, HRTEM has become a truly 'quantitative' technique that enables one to retrieve the atomistic structure of materials with high and well-kn own reliability. At the same time, HRTEM has found new applications: p lan-view imaging of the atom configuration at reconstructed crystal su rfaces; and atomistic in situ observation of diffusion reactions and d efect kinetics in solids.