A. Ali et al., INTERACTION OF IRON WITH TRANSITION-METALS AND ALPHA-RADIATION IN THERMALLY QUENCHED P-SILICON, Semiconductor science and technology, 12(9), 1997, pp. 1100-1105
Iron-induced deep levels have been studied in p-type silicon quenched
from high temperatures, using deep-level transient spectroscopy. The i
nterstitial iron donor and the iron-boron pair defect are observed and
identified by a number of their characteristics including their mutua
l transformation. Our recent work revealed an interesting new property
of the interstitial iron donor defect, namely its complete bleaching
by the transition metals Ag, Au, Pt and Pd in samples which have recei
ved thermal treatment identical to the undoped samples. The study repo
rted here was intended to investigate the relationship of this effect
to the well known iron-boron complex defect known to act as a source o
f the interstitial iron defect by injection-induced dissociation in bo
ron doped p-silicon. Our results show that both the iron-boron complex
and the isolated interstitial iron defects disappear concurrently in
our transition-metal-doped samples. Thus the bleaching of the iron int
erstitial in the presence of the transition metals used is found to be
associated with the bleaching of this source rather than due to some
unknown complex mechanism inhibiting the dissociation of these pairs i
n the presence of the transition metals. In addition, the response of
the iron interstitial defect to irradiation with alpha-particles and i
ts thermal annealing behaviour have been studied. Alpha-irradiation is
seen to lead to a significant suppression of the iron interstitial de
fect, in agreement with the hitherto reported results of electron irra
diation, without causing any significant change in its thermal anneali
ng characteristics.