STRUCTURE, DISSOCIATION, AND THE VIBRATIONAL SIGNATURES OF HYDROGEN CLUSTERS IN AMORPHOUS-SILICON

Authors
Citation
B. Tuttle et Jb. Adams, STRUCTURE, DISSOCIATION, AND THE VIBRATIONAL SIGNATURES OF HYDROGEN CLUSTERS IN AMORPHOUS-SILICON, Physical review. B, Condensed matter, 56(8), 1997, pp. 4565-4572
Citations number
48
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
56
Issue
8
Year of publication
1997
Pages
4565 - 4572
Database
ISI
SICI code
0163-1829(1997)56:8<4565:SDATVS>2.0.ZU;2-J
Abstract
We use quantum molecular dynamics to study the structure, dissociation , and vibrational signatures of hydrogen clusters in amorphous silicon . Four structural models of hydrogenated amorphous silicon and two bul k c-Si:H structures are used for our study. We compare the properties of hydrogen clusters found in the structural models with other theoret ical models and experimental measurements. By examining the energetics of H in these models, we gain insight into the trapping levels for H in a-Si:H films. In addition. we examine the geometric and vibrational properties of the hydrogen clusters as they dissociate. Our simulatio ns are used to interpret the results of recent experiments including a low-temperature infrared study of hydrogenated amorphous silicon duri ng light soaking.