KINETICS OF SILICON INTERACTION WITH TEXTURED TANTALUM RIBBONS

Citation
Vn. Ageev et Ey. Afanaseva, KINETICS OF SILICON INTERACTION WITH TEXTURED TANTALUM RIBBONS, Physics of the solid state, 39(8), 1997, pp. 1318-1323
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637834
Volume
39
Issue
8
Year of publication
1997
Pages
1318 - 1323
Database
ISI
SICI code
1063-7834(1997)39:8<1318:KOSIWT>2.0.ZU;2-R
Abstract
The kinetics of silicon interaction with textured tantalum ribbons hav ing a predominantly (100)-oriented surface has been studied by Auger e lectron spectroscopy. For T<700 K, silicon builds up on the surface. W ithin the 900<T<1000-K interval, after the formation of a monolayer co ating, the excess silicon enters into layer-by-layer growth of the sil icide TaSi2. Within 1150<T<1320 K, this excess silicon reacts with tan talum to produce in a layer-by-layer manner the Ta5Si3 silicide; this compound is unstable and decomposes for T> 1320 K to form Ta Si-4, wit h only one third of the original silicon monolayer being left on the s urface. The activation energy of Ta5Si3 decomposition is 4.3+/-0.2 eV. The activation energy of Si thermal desorption at low coverages is 5. 4+/-0.2 eV. (C) 1997 American Institute of Physics.