Pm. Borsenberger et Ds. Weiss, HOLE TRANSPORT IN TRIPHENYLMETHANE-DOPED POLY(STYRENE), Journal of imaging science and technology, 41(2), 1997, pp. 185-191
Hole mobilities have been measured for a series of triphenylmethane (T
PM) derivatives with different dipole moments doped into poly(styrene)
(PS). The results are described within the framework of a formalism b
ased on disorder, due to Bassler and coworkers. The formalism is premi
sed on the assumption that transport occurs by hopping through a manif
old of localized states that are subject to a distribution of energies
and distances. The key parameters of the formalism are the energy wid
th of the hopping site manifold, the degree of positional disorder, an
d a prefactor mobility. For TPM-doped PS, the widths are between 0.104
and 0.124 eV, increasing with increasing TPM concentration and increa
sing dipole moment. Values of the positional disorder parameter are be
tween 2.0 and 4.5, increasing with increasing dilution. The prefactor
mobilities decrease with increasing dilution and can be described by w
avefunction decay constants of approximately 1.0 Angstrom. The energy
widths are described by a model based on dipolar disorder. According t
o the model, the widths are comprised of a dipolar component and a van
der Waals component. The dipolar components are between 0.012 and 0.0
67 eV, and the van der Waals components are 0.104 eV The van der Waals
components are significantly larger than literature values for PS dop
ed with a wide range of triarylamine (TAA) molecules. The difference i
n the van der Waals components is the principal reason for the very co
nsiderable difference in mobility of TPM- and TAA-doped polymers. For
constant dopant concentrations, the degree of positional disorder and
the prefactor mobilities are essentially the same for all TPM- and TAA
-doped polymers.