KELVIN POTENTIAL MEASUREMENT OF INSULATIVE PARTICLES .1. MECHANISM OFMETAL-OXIDE TRIBOELECTRIC CHARGING AND RELATIVE-HUMIDITY SENSITIVITY

Citation
Rpn. Veregin et al., KELVIN POTENTIAL MEASUREMENT OF INSULATIVE PARTICLES .1. MECHANISM OFMETAL-OXIDE TRIBOELECTRIC CHARGING AND RELATIVE-HUMIDITY SENSITIVITY, Journal of imaging science and technology, 41(2), 1997, pp. 192-196
Citations number
15
Categorie Soggetti
Photographic Tecnology
ISSN journal
10623701
Volume
41
Issue
2
Year of publication
1997
Pages
192 - 196
Database
ISI
SICI code
1062-3701(1997)41:2<192:KPMOIP>2.0.ZU;2-8
Abstract
A new method has been developed to measure the Kelvin contact potentia l difference (CPD) of insulating submicron particles as a function of relative humidity (RH). The insulative particles are dry blended onto the surface of conductive particles at a high relative humidity and th e resultant mixture is conductive, thus, enabling a CPD measurement th at is reflective of the insulative coating. A second modification to t he standard CPD methodology is the use of water as an RH-independent r eference. Using these two new modifications to the Kelvin measurement, the CPD of common xerographic toner additives such as silica, titania , and alumina particles have been determined as a function of RH. The CPD values of these insulative metal oxide particles are compared to t he triboelectric values obtained for the same particles used as surfac e additives on a xerographic toner. A good linear correlation exists b etween the charge of the additive coated toner and the CPD measured as a function of RH. Both the charge level and the RH sensitivity of the charge with the metal oxides can be explained by changes in the metal oxide contact potential. Thus, the mechanism of charging in these met al oxides is dominated by the transfer of electrons between states tha t can be described in terms of work functions. Also concluded is that ion transport has a minor contribution in the mechanism of triboelectr ic charging with these metal oxides.