A novel technique for measuring differential lattice dilation by scann
ing tunneling microscope is proposed. The method was used to measure t
he metastable lattice dilation caused by a deep-shallow phototransform
ation of bistable In impurities in CdF2 crystals. A total linear cryst
al shrinkage of 1.8 x 10(-6) results from a partial counterbalancing o
f the lattice contraction associated with the photoionized deep locali
zed In state by a lattice expansion caused by weakly bound electrons a
t the shallower hydrogenlike state of the bistable In donors. (C) 1997
American Institute of Physics.