A STRUCTURAL CHARACTERIZATION OF ALN THIN-FILM DEPOSITED ON A SINGLE-CRYSTAL AL2O3(0001) SUBSTRATE

Authors
KIM KH CHANG CH KOO YM
Citation
Kh. Kim et al., A STRUCTURAL CHARACTERIZATION OF ALN THIN-FILM DEPOSITED ON A SINGLE-CRYSTAL AL2O3(0001) SUBSTRATE, Journal of materials science letters, 16(17), 1997, pp. 1457-1459
Citations number
8
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
16
Issue
17
Year of publication
1997
Pages
1457 - 1459
Database
ISI
SICI code
0261-8028(1997)16:17<1457:ASCOAT>2.0.ZU;2-O